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ALC ’09
December 6 (Sun) – 11 (Fri), 2009
The Westin Maui Resort & Spa, Maui, Hawaii, USA
(Current date/time: November 19, 2017 / 23:18 JST)
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Scientific Topics

The sessions will cover the following topics:

  1. Fundamental Phenomena
    • electron/ion -solid interactions
    • emission phenomena of light, electrons, and ions
  2. Characterization by Electrons / Ions / Infrared / Ultraviolet / X-rays
    • AES / XPS / XPED / EPMA / ISS / MEIS / RBS / IR / etc.
  3. Imaging Techniques
    • TEM / STEM / AEM / SEM / SAM / SIMS
    • SPM / REM / LEEM / PEEM / FIM / etc.
  4. Applications for Nanotechnology
    • nanowires / nanotubes / nanoparticles
    • solid-solid / solid-liquid interfaces
  5. Cosmic, Terrestrial & Environmental Materials
  6. Special Sessions
    • nanospectroscopy
    • graphene and related materials
    • nanoscale 3-D element imaging
    • medical and biomaterials
    • surface imaging
  7. Workshop
    • new trends in SIMS technology
    • novel analyses with electron beams
  8. Tutorials
JSPS Logo Sponsored by The 141st Committee on Microbeam Analysis
of Japan Society for the Promotion of Science (JSPS)
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