ALC'15 Logo
ALC ’15
October 25 (Sun) – 30 (Fri), 2015
Kunibiki Messe, Matsue, Shimane, JAPAN
(Current date/time: September 26, 2017 / 7:19 JST)
ALC'15 Logo

Scientific Topics

The sessions will cover the following topics:

  1. Fundamental Phenomena
    • electron/ion/photon -solid interactions
    • emission phenomena of light, electrons, and ions
  2. Characterization by Electrons / Ions / Infrared / Ultraviolet / X-rays
    • AES / XPS / XPED / EPMA / ISS / MEIS / RBS / SIMS / IR / etc.
  3. Imaging Techniques
    • TEM / STEM / AEM / SEM / SAM / REM / LEEM / PEEM
    • SPM / FIM / TOF-SIMS / optical molecular imaging / ultrafast imaging / etc.
  4. Applications for Nanotechnology
    • nanowires / nanotubes / nanoparticles / graphene and 2D materials
    • solid-solid / solid-liquid interfaces
  5. Advanced Materials Characterization
    • spintronics materials
    • environmental and advanced energy materials
    • biological and medical systems
    • cosmic and terrestrial materials
  6. Special Sessions
    • 3D holographic imaging and characterizations of active atomic sites
    • chemical imaging and nanoanalysis for biosystems
    • current status and future trends in standardization for surface chemical analysis and microbeam analysis
  7. Tutorials
FOCUS SHIMADZU JEOL Hitachi HighTech Techno-X Scienta Omicron
SPECS Science Laboratories Inc. Pascal VIC International
開発受託21 ツジ電子 HORIBA FEI
JSPS Logo Host Organization: The 141st Committee on Microbeam Analysis, JSPS
Joint Sponsor: The Surface Science Society of Japan
SSSJ Logo